Great success of Innovalia Metrology at Metromeet

Innovalia Metrology has presented it latest developments in Metromeet, the International Conference on Industrial Dimensional Metrology, held in Bilbao on 27 and 28 March. The booth of Innovalia Metrology received a constant affluence of visitors, very interested in M3 portable, the new high definition 3d scanning system, equipped with M3 platform (Multisensor Massive Measurement), which allows to work with the 3D information reliably and efficiently.